Multi-turn visual audit improves accuracy, GLM 4.6 Flash benchmarked
Sentdex · x · 2026-08-31
Sentdex shares practices on iteratively improving AI drawing accuracy: specifying thermal imaging context and hotspot characteristics in the prompt significantly enhanced solar panel hotspot detection generation. For circuit diagrams, using OMP for multi-turn visual audit (3 iterations in 5 seconds) combined with GLM 4.6 Flash for visual checks tightened the wiring and labeling accuracy. Schematic generation in one-shot also outperformed previous attempts.
Related event: Sentdex Tests Iterative Visual Auditing with GLM Flash(3 posts)→
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