Paper analyzes thermal tuning overhead in optical interconnects for MoE training
jwt0625 · x · 2026-08-28
This paper presents a cross-layer analysis of wafer-scale optical interconnects for LLM MoE training. Results show that transient temperature variations can exceed the tracking capability of conventional thermo-optic control loops, introducing tuning stalls. It further evaluates a ferroelectric-based mitigation strategy.
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